Abstract
The increasing complexity of mixed-signal boards makes an integrated analogue/digital testability approach an attractive proposition. This paper investigates one such approach based on the use of mixed-signal test support ICs together with standard board level test infrastructures. The architecture of a test support IC and preliminary experimental results are also presented.

Abstract
The paper discusses the need of a test infrastructure to support the testing of mixed-signal electronic systems, and discusses a general architecture for test support ICs that can be used to build it. An implementation of a subset of this architecture is described together with its application in a practical example.

Abstract
An account is given on the joint time-frequency analysis (JTFA) and the short time-frequency transform algorithm in particular as an alternative technique for dynamic testing of analog to digital converters (ADCs). It is shown that this technique can lead to a significant improvement in ADC testing mainly due the possibility of using non-stationary signals allowing a more rapid test capable of analyzing even localized features.

Abstract
Power supply current monitoring is a promising technique for the development of new test methodologies for analogue and mixed-signal circuits, following the success attained in the digital domain. This paper shows that improved test efficiency and confidence is obtained when both functional output voltage and power supply current signals are observed. Results obtained from simulation of a number of circuits are presented comparing Fault Coverage, Normalised Deviation, and the Coefficient of Variation of faulty responses deviation amplitudes. Also, different test stimuli are compared to evaluate their suitability for testing.

Abstract
The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current /voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and buil-in self test techniques. © 1996 IEEE.

Abstract