Abstract
Power supply current monitoring is a promising technique for the development of new test methodologies for analog and mixed-signal circuits. The advantages of efficiency and reduced test time have already been recognized in the digital domain. This paper shows that improved test efficiency and detection confidence are obtained when both output voltage and power supply current are observed. Results found from the simulation of two circuits are presented comparing fault detection ratios and the amplitude of faulty response deviations when observing each one of these signals. Cross-correlation between output voltage and power supply current is presented as a means to perform a single mixed current/voltage testing operation, providing at the same time increased efficiency. It allows also for simplifications on test circuitry and processing, as reductions on the sampling rates and amplitude resolutions used to acquire the signals provide the same fault coverage levels obtained using higher fidelity measurements.

Abstract

Abstract
This paper presents experiments carried out with a prototype test chip provided by the IEEE P1149.4 Mixed-Signal Testing Working Group, which explore the architecture of the proposed analogue boundary module to implement simultaneous observation of power supply current and output voltage, towards mixed current/voltage testing of analogue and mixed-signal circuits.

Abstract
Reducing the area overhead required by BIST structures can be achieved by reconfiguring existing hardware to perform test related control and processing functions. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmable logic available in the system. Structural and functional tests are performed using correlation to obtain iDD and uOUT cross-correlation signatures, and to measure gain, phase, and total harmonic distortion. © 2000 IEEE.

Abstract
Analog-to-digital converter (ADC) characterization is usually performed using stationary stimuli like sine waves. However, the use of a non-stationary stimulus, besides providing testing conditions closer to those found in real applications, can lead to interesting improvements in ADC testing speed, This kind of signal needs proper processing techniques in order to extract useful information. In this paper we propose the use of joint time-frequency analysis (JTFA) for this purpose. The basic principles of the technique, and how it can be used in ADC testing are presented. in particular, a method for characterising an ADC on its entire bandwidth using a single stimulus is described.

Abstract
A method for the in-circuit functional testing of SigmaDelta modulators is described which can be built in large integrated circuits or systems-on-chip. It allows for measuring gain and phase, as well as total harmonic distortion and signal to noise and harmonic distortion ratio parameters. This method can be built in-circuit using existing computational resources, such as digital signal processors or (re)configurable logic, which can therefore be used to implement both mission and test operations. Both simulation and experimental results were obtained which are in close agreement with those expected from the theory.