Abstract
BST is a well established standard and testability framework for digital ICs and boards. The paper presents a test support IC controlled by an IEEE1149.1 interface, capable of providing access to analog nodes in mixed-signal boards. The proposed architecture (ABSINT - Analog to Boundary Scan Interface) is described and relevant implementation issues are discussed. A demonstrator IC implementing the ABSINT architecture is presented, and it is shown how it can be used to provide analog test channels under control of IEEE1149.1.

Abstract
Power supply current monitoring is a promising technique for the development of new test methodologies for analogue and mixed-signal circuits, following the success attained in the digital domain. This paper shows that improved test efficiency and confidence is obtained when both functional output voltage and power supply current signals are observed. Results obtained from simulation of a number of circuits are presented comparing Fault Coverage, Normalised Deviation, and the Coefficient of Variation of faulty responses deviation amplitudes. Also, different test stimuli are compared to evaluate their suitability for testing.

Abstract
The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current /voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and buil-in self test techniques. © 1996 IEEE.

Abstract

Abstract
In this paper, we present an application of the simulation annealing optimization algorithm to the problem of high-level synthesis of digital systems, targeted to architectures with run-time reconfigurable functional units. The scheduling, allocation and binding problems are treated simultaneously. Reconfiguration times and execution delays are taken into account, along with pipelined execution and precise clock cycles for consumption of each operand.

Abstract
Power supply current monitoring is a promising technique for the development of new test methodologies for analog and mixed-signal circuits. The advantages of efficiency and reduced test time have already been recognized in the digital domain. This paper shows that improved test efficiency and detection confidence are obtained when both output voltage and power supply current are observed. Results found from the simulation of two circuits are presented comparing fault detection ratios and the amplitude of faulty response deviations when observing each one of these signals. Cross-correlation between output voltage and power supply current is presented as a means to perform a single mixed current/voltage testing operation, providing at the same time increased efficiency. It allows also for simplifications on test circuitry and processing, as reductions on the sampling rates and amplitude resolutions used to acquire the signals provide the same fault coverage levels obtained using higher fidelity measurements.